XDIF1: X-Ray Diffractometer

Model: Philips X’Pert PRO MRD HR X-Ray Diffraction System
Location: 1537 Fitzpatrick CIEMAS
Tool Group and Rate: XDIF - $15.5/$31 per hour

Training Request Training for XDIF1 Training Checklist for XDIF1 Operating Procedures Rocking Curve Measurement Diffraction Space Maps Reflectivity Measurement Texture – Pole Figures 2theta Phase Analysis Measurement 2theta Phase Analysis – Grazing Incident Helpful Links Panalytical Website Homepage Panalytical X'Pert Pro Stanford Univeristy X-ray lab

The X'Pert PRO diffraction system utilizes a modular system approach to provide no-compromise performance for applications ranging from routine characterization to in-depth research investigations. The PreFIX (Pre-aligned Fast-Interchangeable X-ray optics) concept enables the diffraction system to be reconfigured in a few minutes without the need for re-alignment to handle different types of analysis. A suite of data analysis software from Philips is available.

Applications	• Rocking curves • Reciprocal space mapping • Phase identification and quantification • Stress analysis • Texture analysis • Reflectivity
X-Ray source	Cu Ka (1.5405 Å)
Incident beam optics	• Hybrid monochromator • Ge(440) monochromator • X-Ray mirror • Fixed divergence slit • Cross slit
Diracted beam optics	• Triple axis and rocking curve attachment • Parallel Plate collimator • Programmable receiving slit
Detectors	Two sealed proportional detectors: 84% efficiency of Cu Ka
Goniometer	High resolution: min step size is 0.0001
Sample holders	Wafer holder with 4 prong clips for pieces up to 4” diameter
Philips X’Pert Sotware	• Data Collector • Epitaxy (Rocking curve fit and simulation) • Texture (Texture analysis) • SmoothFit (Automated Fitting)