| Applications |
- RF sputtering of up to 3 different materials
- Materials currently available:
- ITO(in location 1)
- SiO2 (in location 2)
- Si3N4(in location 3)
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| Features |
- Optical thickness monitoring at multiple wavelengths in the VIS or IR spectrums
- RF bias of substrate
- Substrate heating
- Subtrate rotation to improve uniformity
- Argon and oxygen gases
- Touch screen interface
- PID loop pressure control
- D-shape 304 stainless steel chamber
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| Specifications |
- Ability to process up to 150mm samples
- 600W RF source with auto-tuning matching network
- 100W RF sample bias source
- Substrate temperature control up to 350C
- Three 3-inch sputter targets
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