SEM1: Scanning Electron Microscope

Model: FEI XL30 SEM-FEG
Location: 1557 and 1567 Fitzpatrick CIEMAS
Tool Group and Rate: SEM - $20.6/$41.2 per hour

Training Request Training for SEM1 Training Checklist for SEM1 Operating Procedures Imaging Procedure Safe Usage of the FEI SEM Processing Biological SEM Samples Helpful Links FEI Company JCNabity NPGS

The FEI XL30 SEM offers ultra high resolution secondary electron imaging of a variety of samples. It can achieve magnifications of over 300,000X and has excellent depth of field. Minimal sample preparation is required because the highly coherent  beam produced by the field emission gun allows the use of very low beam voltages for imaging.

Applications	High Resolution Imaging
Benefits	True secondary electron imaging Minimal charging of non-conductive samples Low-Z materials
Resolution	~ 2-3nm (Imaging)
Stage	X,Y,Z, Rotation and Tilt movement