AFM1: Scanning Probe Microscope

Model: Digital Instruments Dimension 3100
Location: 1545 Fitzpatrick CIEMAS
Tool Group and Rate: AFM / ZYGO / MSA - $15.5/$31 per hour

Training Request Training for AFM1 Training Checklist for AFM1 Operating Procedures AFM1 Imaging procedure - Nanoscope 6.14r1 AFM1 Fluid Cell Procedure AFM1 Imaging procedure - Nanoscope SPM Helpful Links Veeco D3100 Website

The scanning probe microscope (SPM) produces high resolution, three dimensional images by scanning a sharp tip over the sample surface. The name “scanning probe microscopy” (SPM) summarizes various measurement techniques such as atomic force microscopy (AFM), electric force microscopy (EFM). The Dimension 3100 brings together all of the major SPM techniques in a single platform that handles a wide range of sample types and sizes, up to eight inches in diameter, in air or fluids. The system's intuitive software, easy setup and alignment, and automated, intelligent sample approach streamline work and prevent damage to valuable samples.

Applications & Scanning Techniques	Sample imaging in air or fluid Contact mode AFM Tapping mode AFM Lateral Force Mode Force Imaging Magnetic Force Imaging Electric Force Microscopy (EFM) Nanolithography
Noise	<0.5 Å RMS in vertical (Z) dimension with acoustic/vibration isolation Mounted on vibration isolation table
Microscope	Dimension SPM head 90 µm square X-Y imaging area 6 µm Z range
Samples	Up to 150mm in diameter Up to 12mm thick Wet samples: fluid cell allows immersion of microscope head to max depth of 7mm
Stage	125 x 100 mm inspectable area 2 µm resolution
Tip Viewing	On-axis, real-time via microscope optics