X-Ray Lab

Location: 1537 Fitzpatrick CIEMAS

CODE	EQUIPMENT	MODEL	APPLICATIONS
XDIF1	X-Ray Diffractometer	Philips X’Pert PRO MRD HR X-Ray Diffraction System	The X-Ray diffraction system can be used for characterizing structural properties of a wide range of materials
XPS1	X-Ray Photoelectron Spectrometer	Kratos Analytical Axis Ultra	XPS is a technique for the detection of variations in chemical composition and oxidation state. The AXIS Ultra provides a high energy resolution capability for both conductive and insulating samples.